专利名称：Apparatus and method for the inspection of
the surface of a component
发明人：Baumgartner Manfred申请号：US12320076申请日：20090116
公开号：US20090185177A1公开日：20090723
专利附图：
摘要：An apparatus for inspection of a surface of a component includes a probingdevice () which is coupled to a traversing device () and has at least one probe carrier (), towhich at least one inspection mechanism is fitted. In order to enable surface defects in a
component () to be shown directly and without conversion, the inspection mechanism isan image pick-up unit ().
申请人：Baumgartner Manfred
地址：Berlin DE
国籍：DE
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